High-resolution atomic force microscope (AFM)
portal.deutsche-evergabe.de (Bavarian tender portal), procedure 604121
Overview
The Free State of Bavaria, represented by the University of Bayreuth, is procuring a high-resolution atomic force microscope (AFM) through an open procedure under the German Public Procurement Ordinance (VgV). Electronic offers are allowed. The offer deadline is 27 November 2026 at 10:00 (UTC+01:00, German time). The official summary gives the subject only as the title and the CPV codes for microscopes and scanning probe microscopes. The tender documents are available through a partner system. No value or award criteria are stated.
Information based on the public notice
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What the buyer needs
Procurement of a high-resolution atomic force microscope (AFM) for the University of Bayreuth, open procedure under VgV.
- Tender documents are available free of charge in the partner system; registration on the portal is recommended to receive changes.
Tender details
- Buyer
- Freistaat Bayern, vertreten durch die Universität Bayreuth
- Country
Germany
- Procedure
- Open procedure under the German Public Procurement Ordinance (VgV)
- Classification
- Pharmaceuticals and laboratory supplies · 38510000-3 Microscopes; 38514200-3 Scanning probe microscopes
- Notice reference
- 720dd6ee-34a2-4ae8-b2d9-0cb5d7a2b23a
- Offer deadline
- 27 November 2026, 10:00 (UTC+01:00)
- Electronic offers
- Allowed
- File reference
- 22247/26MS
What to check in the tender documents
- The official summary does not state an estimated value or award criteria.
- The technical specification and the tender documents are in the partner system and were not part of this public record.
Original notice
Read the original description
Höchstauflösendes Rasterkraftmikroskop (AFM)
Official source: portal.deutsche-evergabe.de (Bavarian tender portal), procedure 604121 ↗
Notice updates
November 12, 2026 · Version 2
Summary and analysis updated
Höchstauflösendes Rasterkraftmikroskop (AFM)
Höchstauflösendes Rasterkraftmikroskop (AFM) Mikroskope Rastersondenmikroskope
November 12, 2026 · Version 1
Published
Höchstauflösendes Rasterkraftmikroskop (AFM)
Höchstauflösendes Rasterkraftmikroskop (AFM) Mikroskope Rastersondenmikroskope
https://portal.deutsche-evergabe.de/verfahren/BekSummaryModal/720dd6ee-34a2-4ae8-b2d9-0cb5d7a2b23a?isProd=true&FullSize=false&DashOff=true&UID=
Source retrieved: 2026-11-12T03:39:48Z